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p-type CuO nanowire photodetectors
A. García Marín
, C. García Núñez
, E. Ruiz
, J. Piqueras
, J.L. Pau
Research output
:
Contribution to conference
›
Poster
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Keyphrases
Nanostructures
100%
Cuprous Oxide
100%
P-type
100%
Nanowire Photodetectors
100%
Oxide Nanotubes
100%
Nanowires
50%
Photodetector
33%
Copper Foil
33%
Aluminum Electrode
33%
High Sensitivity
16%
Photolithography
16%
Fast Response
16%
Scanning Electron Microscope
16%
Time Response
16%
Product Process
16%
Biomolecules
16%
Rise Time
16%
Optical Microscope
16%
Dielectrophoresis
16%
Dielectric Constant
16%
Copper(II) Oxide
16%
Metal Oxide
16%
Gas Molecules
16%
Visible Spectrum
16%
Long-term Processes
16%
High Conductivity
16%
Optical Response
16%
Surface-to-volume Ratio
16%
Frequency Peaks
16%
Optical Sensor
16%
Bias Voltage
16%
Thermal Oxidation
16%
Silicon Wafer
16%
Slow Response
16%
Spectral Response
16%
High Aspect Ratio
16%
Current-voltage Characteristics
16%
Photocurrent
16%
Decay Time
16%
Metal Oxide Nanowires
16%
Aligned Nanowires
16%
Thin Oxides
16%
High Crystal Quality
16%
Chemical Etching
16%
Infrared Range
16%
Rectifying Behavior
16%
Halogen Lamp
16%
Corrosive Substances
16%
Electrode Gap
16%
AC Electric Field
16%
Chemical Products
16%
Practical Operation
16%
Inset
16%
Controlled Alignment
16%
Full-visible-spectrum
16%
Electro-optical Response
16%
SiO2 Thin Film
16%
Response Value
16%
Low-cost Approach
16%
Peak Voltage
16%
Heater
16%
Microtechnology
16%
Electromagnetic Spectrum
16%
Voltage Gap
16%
Chemisorption
16%
Mesoscopic Device
16%
Crystal Surface
16%
Optical Gain
16%
Functional Devices
16%
Optical Band Gap
16%
Speed Sensitivity
16%
Actual Time
16%
Engineering
Nanowire
100%
Photometer
100%
Nanomaterial
66%
Copper Foil
22%
Building Block
11%
Optical Lithography
11%
Thin Films
11%
Dielectrics
11%
Response Value
11%
Main Issue
11%
Fast Response
11%
Peak Frequency
11%
Biomolecule
11%
Photocurrent
11%
Optical Microscope
11%
Current-Voltage Characteristic
11%
Volume Ratio
11%
Bias Voltage
11%
Thermal Oxidation
11%
Silicon Wafer
11%
Optical Sensors
11%
Spectral Response
11%
High Aspect Ratio
11%
Optoelectronics
11%
Decay Time
11%
Rise Time
11%
Oxide Layer
11%
Crystal Quality
11%
Optical Gain
11%
Crystal Surface
11%
Microtechnology
11%
Gas Molecule
11%
Electrode Gap
11%
Transient Analysis
11%
Band Gap
11%
Scanning Electron Microscope
11%
Silicon Dioxide
11%
Electric Field
11%
Material Science
Oxide Compound
100%
Nanowire
100%
Nanostructure
66%
Metal Oxide
22%
Aluminum
22%
Thin Films
11%
Oxidation Reaction
11%
Scanning Electron Microscopy
11%
Permittivity
11%
Chemisorption
11%
Silicon Wafer
11%
Current Voltage Characteristics
11%
Lamp
11%
Microtechnology
11%