High precision detection of change in intermediate range order of amorphous zirconia-doped tantala thin films due to annealing
- K. Prasai*
- , J. Jiang
- , A. Mishkin
- , B. Shyam
- , S. Angelova
- , R. Birney
- , D.A. Drabold
- , M. Fazio
- , E.K. Gustafson
- , G. Harry
- , S. Hoback
- , J. Hough
- , C. Levesque
- , I. MacLaren
- , A. Markosyan
- , I.W. Martin
- , C.S. Menoni
- , P.G. Murray
- , S. Penn
- , S. Reid
*Corresponding author for this work
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