High precision detection of change in intermediate range order of amorphous zirconia-doped tantala thin films due to annealing

K. Prasai*, J. Jiang, A. Mishkin, B. Shyam, S. Angelova, R. Birney, D.A. Drabold, M. Fazio, E.K. Gustafson, G. Harry, S. Hoback, J. Hough, C. Levesque, I. MacLaren, A. Markosyan, I.W. Martin, C.S. Menoni, P.G. Murray, S. Penn, S. Reid & 10 others R. Robie, S. Rowan, F. Schiettekatte, R. Shink, A. Turner, G. Vajente, H.-P. Cheng, M.M. Fejer, A. Mehta, R. Bassiri

*Corresponding author for this work

Research output: Contribution to journalArticle

Abstract

Understanding the local atomic order in amorphous thin film coatings and how it relates to macroscopic performance factors, such as mechanical loss, provides an important path towards enabling the accelerated discovery and development of improved coatings. High precision x-ray scattering measurements of thin films of amorphous zirconia-doped tantala (ZrO2−Ta2O5) show systematic changes in intermediate range order (IRO) as a function of postdeposition heat treatment (annealing). Atomic modeling captures and explains these changes, and shows that the material has building blocks of metal-centered polyhedra and the effect of annealing is to alter the connections between the polyhedra. The observed changes in IRO are associated with a shift in the ratio of corner-sharing to edge-sharing polyhedra. These changes correlate with changes in mechanical loss upon annealing, and suggest that the mechanical loss can be reduced by developing a material with a designed ratio of corner-sharing to edge-sharing polyhedra.
Original languageEnglish
Article number045501
Number of pages6
JournalPhysical Review Letters
Volume123
Issue number4
DOIs
Publication statusPublished - 23 Jul 2019
Externally publishedYes

Cite this

Prasai, K. ; Jiang, J. ; Mishkin, A. ; Shyam, B. ; Angelova, S. ; Birney, R. ; Drabold, D.A. ; Fazio, M. ; Gustafson, E.K. ; Harry, G. ; Hoback, S. ; Hough, J. ; Levesque, C. ; MacLaren, I. ; Markosyan, A. ; Martin, I.W. ; Menoni, C.S. ; Murray, P.G. ; Penn, S. ; Reid, S. ; Robie, R. ; Rowan, S. ; Schiettekatte, F. ; Shink, R. ; Turner, A. ; Vajente, G. ; Cheng, H.-P. ; Fejer, M.M. ; Mehta, A. ; Bassiri, R. / High precision detection of change in intermediate range order of amorphous zirconia-doped tantala thin films due to annealing. In: Physical Review Letters. 2019 ; Vol. 123, No. 4.
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abstract = "Understanding the local atomic order in amorphous thin film coatings and how it relates to macroscopic performance factors, such as mechanical loss, provides an important path towards enabling the accelerated discovery and development of improved coatings. High precision x-ray scattering measurements of thin films of amorphous zirconia-doped tantala (ZrO2−Ta2O5) show systematic changes in intermediate range order (IRO) as a function of postdeposition heat treatment (annealing). Atomic modeling captures and explains these changes, and shows that the material has building blocks of metal-centered polyhedra and the effect of annealing is to alter the connections between the polyhedra. The observed changes in IRO are associated with a shift in the ratio of corner-sharing to edge-sharing polyhedra. These changes correlate with changes in mechanical loss upon annealing, and suggest that the mechanical loss can be reduced by developing a material with a designed ratio of corner-sharing to edge-sharing polyhedra.",
author = "K. Prasai and J. Jiang and A. Mishkin and B. Shyam and S. Angelova and R. Birney and D.A. Drabold and M. Fazio and E.K. Gustafson and G. Harry and S. Hoback and J. Hough and C. Levesque and I. MacLaren and A. Markosyan and I.W. Martin and C.S. Menoni and P.G. Murray and S. Penn and S. Reid and R. Robie and S. Rowan and F. Schiettekatte and R. Shink and A. Turner and G. Vajente and H.-P. Cheng and M.M. Fejer and A. Mehta and R. Bassiri",
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Prasai, K, Jiang, J, Mishkin, A, Shyam, B, Angelova, S, Birney, R, Drabold, DA, Fazio, M, Gustafson, EK, Harry, G, Hoback, S, Hough, J, Levesque, C, MacLaren, I, Markosyan, A, Martin, IW, Menoni, CS, Murray, PG, Penn, S, Reid, S, Robie, R, Rowan, S, Schiettekatte, F, Shink, R, Turner, A, Vajente, G, Cheng, H-P, Fejer, MM, Mehta, A & Bassiri, R 2019, 'High precision detection of change in intermediate range order of amorphous zirconia-doped tantala thin films due to annealing', Physical Review Letters, vol. 123, no. 4, 045501. https://doi.org/10.1103/PhysRevLett.123.045501

High precision detection of change in intermediate range order of amorphous zirconia-doped tantala thin films due to annealing. / Prasai, K.; Jiang, J.; Mishkin, A.; Shyam, B.; Angelova, S.; Birney, R.; Drabold, D.A.; Fazio, M.; Gustafson, E.K.; Harry, G.; Hoback, S.; Hough, J.; Levesque, C.; MacLaren, I.; Markosyan, A.; Martin, I.W.; Menoni, C.S.; Murray, P.G.; Penn, S.; Reid, S.; Robie, R.; Rowan, S.; Schiettekatte, F.; Shink, R.; Turner, A.; Vajente, G.; Cheng, H.-P.; Fejer, M.M.; Mehta, A.; Bassiri, R.

In: Physical Review Letters, Vol. 123, No. 4, 045501, 23.07.2019.

Research output: Contribution to journalArticle

TY - JOUR

T1 - High precision detection of change in intermediate range order of amorphous zirconia-doped tantala thin films due to annealing

AU - Prasai, K.

AU - Jiang, J.

AU - Mishkin, A.

AU - Shyam, B.

AU - Angelova, S.

AU - Birney, R.

AU - Drabold, D.A.

AU - Fazio, M.

AU - Gustafson, E.K.

AU - Harry, G.

AU - Hoback, S.

AU - Hough, J.

AU - Levesque, C.

AU - MacLaren, I.

AU - Markosyan, A.

AU - Martin, I.W.

AU - Menoni, C.S.

AU - Murray, P.G.

AU - Penn, S.

AU - Reid, S.

AU - Robie, R.

AU - Rowan, S.

AU - Schiettekatte, F.

AU - Shink, R.

AU - Turner, A.

AU - Vajente, G.

AU - Cheng, H.-P.

AU - Fejer, M.M.

AU - Mehta, A.

AU - Bassiri, R.

PY - 2019/7/23

Y1 - 2019/7/23

N2 - Understanding the local atomic order in amorphous thin film coatings and how it relates to macroscopic performance factors, such as mechanical loss, provides an important path towards enabling the accelerated discovery and development of improved coatings. High precision x-ray scattering measurements of thin films of amorphous zirconia-doped tantala (ZrO2−Ta2O5) show systematic changes in intermediate range order (IRO) as a function of postdeposition heat treatment (annealing). Atomic modeling captures and explains these changes, and shows that the material has building blocks of metal-centered polyhedra and the effect of annealing is to alter the connections between the polyhedra. The observed changes in IRO are associated with a shift in the ratio of corner-sharing to edge-sharing polyhedra. These changes correlate with changes in mechanical loss upon annealing, and suggest that the mechanical loss can be reduced by developing a material with a designed ratio of corner-sharing to edge-sharing polyhedra.

AB - Understanding the local atomic order in amorphous thin film coatings and how it relates to macroscopic performance factors, such as mechanical loss, provides an important path towards enabling the accelerated discovery and development of improved coatings. High precision x-ray scattering measurements of thin films of amorphous zirconia-doped tantala (ZrO2−Ta2O5) show systematic changes in intermediate range order (IRO) as a function of postdeposition heat treatment (annealing). Atomic modeling captures and explains these changes, and shows that the material has building blocks of metal-centered polyhedra and the effect of annealing is to alter the connections between the polyhedra. The observed changes in IRO are associated with a shift in the ratio of corner-sharing to edge-sharing polyhedra. These changes correlate with changes in mechanical loss upon annealing, and suggest that the mechanical loss can be reduced by developing a material with a designed ratio of corner-sharing to edge-sharing polyhedra.

U2 - 10.1103/PhysRevLett.123.045501

DO - 10.1103/PhysRevLett.123.045501

M3 - Article

VL - 123

JO - Physical Review Letters

JF - Physical Review Letters

SN - 0031-9007

IS - 4

M1 - 045501

ER -