Abstract
A direct optimal calculation method was proposed to determine the thickness, refractive index, and extinction coefficient of thin films solely from experimental transmittance data. Unlike conventional approaches, this method does not rely on any dispersion model. Numerical and experimental analyses confirm its accuracy. The variations in refractive index and extinction coefficient curves demonstrate the chemical bond properties of chalcogenide films. This work provides a useful method for analyzing the optical parameters of the optical films.
| Original language | English |
|---|---|
| Article number | 163 |
| Number of pages | 7 |
| Journal | Applied Physics B |
| Volume | 131 |
| DOIs | |
| Publication status | Published - 21 Jul 2025 |
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