Comparison of single-layer and double-layer anti-reflection coatings using laser-induced damage threshold and photothermal common-path interferometry

Caspar Clark, Riccardo Bassiri, Iain W. Martin, Ashot Markosyan, Peter G. Murray, Desmond Gibson, Sheila Rowan, Martin M. Fejer

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5 Citations (Scopus)

Abstract

The dielectric thin-film coating on high-power optical components is often the weakest region and will fail at elevated optical fluences. A comparison of single-layer coatings of ZrO2, LiF, Ta2O5, SiN, and SiO2 along with anti-reflection (AR) coatings optimized at 1064 nm comprised of ZrO2 and Ta2O5 was made, and the results of photothermal common-path interferometry (PCI) and a laser-induced damage threshold (LIDT) are presented here. The coatings were grown by radio frequency (RF) sputtering, pulsed direct-current (DC) sputtering, ion-assisted electron beam evaporation (IAD), and thermal evaporation. Test regimes for LIDT used pulse durations of 9.6 ns at 100 Hz for 1000-on-1 and 1-on-1 regimes at 1064 nm for single-layer and AR coatings, and 20 ns at 20 Hz for a 200-on-1 regime to compare the //ZrO2/SiO2 AR coating.
Original languageEnglish
Article number20
JournalCoatings
Volume6
Issue number2
DOIs
Publication statusPublished - 10 May 2016

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