@inproceedings{ec48350e36684955a483c17398048b9a,
title = "Closed field magnetron sputtering: new generation sputtering process for optical coatings",
abstract = "{"}Closed field{"} magnetron (CFM) sputtering offers a flexible and high throughput deposition process for optical coatings and thin films. CFM sputtering uses two or more different metal targets to deposit multilayers comprising a wide range of dielectrics, metals and conductive oxides. Moreover, CFM provides a room temperature deposition process with high ion current density, low bias voltage and reactive oxidation in the entire volume around the rotating substrate drum carrier, thereby producing films over a large surface area at high deposition rate with excellent and reproducible optical properties. Machines based on the Closed Field are scaleable to meet a range of batch and in-line size requirements. Typically, thin film thickness control to <±1% is accomplished simply using time, although optical monitoring can be used for more demanding applications. Fine layer thickness control and deposition of graded index layers is also assisted with a specially designed rotating shutter mechanism. This paper presents data on optical properties for CFM deposited optical coatings, including anti-reflection, thermal control filters, graded coatings, narrowband filters as well as conductive transparent oxides such as indium tin oxide and carbide films. Benefits of the CFM sputter process are described.",
author = "Gibson, {D. R.} and I. Brinkley and Waddell, {E. M.} and Walls, {J. M.}",
year = "2008",
month = sep,
day = "25",
doi = "10.1117/12.797152",
language = "English",
series = "Proceedings of the Society of Photo-Optical Instrumentation Engineers",
publisher = "Society of Photo-Optical Instrumentation Engineers",
editor = "Norbert Kaiser and Michel Lequime and Macleod, {H. Angus}",
booktitle = "Advances in Optical Thin Films III",
address = "United States",
}