Characterisation of optical thin films obtained by plasma ion-assisted deposition

Frank Placido, Des Gibson, Ewan Waddell, Edward Crossan

Research output: Contribution to conferencePaper

Original languageEnglish
Number of pages1
DOIs
Publication statusPublished - 13 Aug 2006
Externally publishedYes
EventSPIE Optics & Photonics - San Diego Convention Center, San Diego, United States
Duration: 13 Aug 200617 Aug 2006

Conference

ConferenceSPIE Optics & Photonics
CountryUnited States
CitySan Diego
Period13/08/0617/08/06

Cite this

Placido, F., Gibson, D., Waddell, E., & Crossan, E. (2006). Characterisation of optical thin films obtained by plasma ion-assisted deposition. Paper presented at SPIE Optics & Photonics, San Diego, United States. https://doi.org/10.1117/12.681027
Placido, Frank ; Gibson, Des ; Waddell, Ewan ; Crossan, Edward. / Characterisation of optical thin films obtained by plasma ion-assisted deposition. Paper presented at SPIE Optics & Photonics, San Diego, United States.1 p.
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Placido, F, Gibson, D, Waddell, E & Crossan, E 2006, 'Characterisation of optical thin films obtained by plasma ion-assisted deposition' Paper presented at SPIE Optics & Photonics, San Diego, United States, 13/08/06 - 17/08/06, . https://doi.org/10.1117/12.681027

Characterisation of optical thin films obtained by plasma ion-assisted deposition. / Placido, Frank; Gibson, Des; Waddell, Ewan; Crossan, Edward.

2006. Paper presented at SPIE Optics & Photonics, San Diego, United States.

Research output: Contribution to conferencePaper

TY - CONF

T1 - Characterisation of optical thin films obtained by plasma ion-assisted deposition

AU - Placido, Frank

AU - Gibson, Des

AU - Waddell, Ewan

AU - Crossan, Edward

PY - 2006/8/13

Y1 - 2006/8/13

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UR - http://www.mendeley.com/research/characterisation-optical-thin-films-obtained-plasma-ion-assisted-deposition

U2 - 10.1117/12.681027

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M3 - Paper

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Placido F, Gibson D, Waddell E, Crossan E. Characterisation of optical thin films obtained by plasma ion-assisted deposition. 2006. Paper presented at SPIE Optics & Photonics, San Diego, United States. https://doi.org/10.1117/12.681027