Analytical simulation of RBS spectra of nanowire samples

Nuno P. Barradas; Carlos García Núñez; Andres Redondo-Cubero; G. Shen; Patrick Kung; Jose Luis Pau

doi:10.1016/j.nimb.2015.08.080

Analytical simulation of RBS spectra of nanowire samples

Nuno P. Barradas
, Carlos García Núñez
, Andres Redondo-Cubero
, G. Shen
, Patrick Kung
, Jose Luis Pau

Research output: Contribution to journal › Article › peer-review

9 Citations (Scopus)

56 Downloads (Pure)

Abstract

Almost all, if not all, general purpose codes for analysis of Ion Beam Analysis data have been originally developed to handle laterally homogeneous samples only. This is the case of RUMP, NDF, SIMNRA, and even of the Monte Carlo code Corteo. General-purpose codes usually include only limited support for lateral inhomogeneity. In this work, we show analytical simulations of samples that consist of a layer of parallel oriented nanowires on a substrate, using a model implemented in NDF. We apply the code to real samples, made of vertical ZnO nanowires on a sapphire substrate. Two configurations of the nanowires were studied: 40 nm diameter, 4.1 μm height, 3.5% surface coverage; and 55 nm diameter, 1.1 μm height, 42% surface coverage. We discuss the accuracy and limits of applicability of the analysis.

Original language	English
Pages (from-to)	116-120
Number of pages	5
Journal	Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Volume	371
Early online date	8 Sept 2015
DOIs	https://doi.org/10.1016/j.nimb.2015.08.080
Publication status	Published - 15 Mar 2016
Externally published	Yes

Keywords

simulation
NDF
RBS
nanowires
ZnO

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10.1016/j.nimb.2015.08.080

2015 08 28 Barradas et al Analytical acceptedAccepted author manuscript, 3.33 MBLicence: CC BY-NC-ND

Cite this

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title = "Analytical simulation of RBS spectra of nanowire samples",

abstract = "Almost all, if not all, general purpose codes for analysis of Ion Beam Analysis data have been originally developed to handle laterally homogeneous samples only. This is the case of RUMP, NDF, SIMNRA, and even of the Monte Carlo code Corteo. General-purpose codes usually include only limited support for lateral inhomogeneity. In this work, we show analytical simulations of samples that consist of a layer of parallel oriented nanowires on a substrate, using a model implemented in NDF. We apply the code to real samples, made of vertical ZnO nanowires on a sapphire substrate. Two configurations of the nanowires were studied: 40 nm diameter, 4.1 μm height, 3.5\% surface coverage; and 55 nm diameter, 1.1 μm height, 42\% surface coverage. We discuss the accuracy and limits of applicability of the analysis.",

keywords = "simulation, NDF, RBS, nanowires, ZnO",

author = "Barradas, \{Nuno P.\} and \{Garc{\'i}a N{\'u}{\~n}ez\}, Carlos and Andres Redondo-Cubero and G. Shen and Patrick Kung and Pau, \{Jose Luis\}",

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doi = "10.1016/j.nimb.2015.08.080",

language = "English",

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T1 - Analytical simulation of RBS spectra of nanowire samples

AU - Barradas, Nuno P.

AU - García Núñez, Carlos

AU - Redondo-Cubero, Andres

AU - Shen, G.

AU - Kung, Patrick

AU - Pau, Jose Luis

N1 - ORCID Reference type: [bibtex]; ORCID Reference: [@article{RID:0525180901704-20, title = {Analytical simulation of RBS spectra of nanowire samples}, journal = {Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms}, year = {2016}, author = {Barradas, Nuno P. and García Núñez, C. and Redondo-Cubero, A. and Shen, G. and Kung, P. and Pau, J. L.}, volume = {371}, pages = {116-120} }]

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N2 - Almost all, if not all, general purpose codes for analysis of Ion Beam Analysis data have been originally developed to handle laterally homogeneous samples only. This is the case of RUMP, NDF, SIMNRA, and even of the Monte Carlo code Corteo. General-purpose codes usually include only limited support for lateral inhomogeneity. In this work, we show analytical simulations of samples that consist of a layer of parallel oriented nanowires on a substrate, using a model implemented in NDF. We apply the code to real samples, made of vertical ZnO nanowires on a sapphire substrate. Two configurations of the nanowires were studied: 40 nm diameter, 4.1 μm height, 3.5% surface coverage; and 55 nm diameter, 1.1 μm height, 42% surface coverage. We discuss the accuracy and limits of applicability of the analysis.

AB - Almost all, if not all, general purpose codes for analysis of Ion Beam Analysis data have been originally developed to handle laterally homogeneous samples only. This is the case of RUMP, NDF, SIMNRA, and even of the Monte Carlo code Corteo. General-purpose codes usually include only limited support for lateral inhomogeneity. In this work, we show analytical simulations of samples that consist of a layer of parallel oriented nanowires on a substrate, using a model implemented in NDF. We apply the code to real samples, made of vertical ZnO nanowires on a sapphire substrate. Two configurations of the nanowires were studied: 40 nm diameter, 4.1 μm height, 3.5% surface coverage; and 55 nm diameter, 1.1 μm height, 42% surface coverage. We discuss the accuracy and limits of applicability of the analysis.

KW - simulation

KW - NDF

KW - RBS

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KW - ZnO

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DO - 10.1016/j.nimb.2015.08.080

M3 - Article

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VL - 371

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JO - Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

ER -

Analytical simulation of RBS spectra of nanowire samples

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