Analytical simulation of RBS spectra of nanowire samples

Nuno P. Barradas, Carlos García Núñez, Andres Redondo-Cubero, G. Shen, Patrick Kung, Jose Luis Pau

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)
30 Downloads (Pure)


Almost all, if not all, general purpose codes for analysis of Ion Beam Analysis data have been originally developed to handle laterally homogeneous samples only. This is the case of RUMP, NDF, SIMNRA, and even of the Monte Carlo code Corteo. General-purpose codes usually include only limited support for lateral inhomogeneity. In this work, we show analytical simulations of samples that consist of a layer of parallel oriented nanowires on a substrate, using a model implemented in NDF. We apply the code to real samples, made of vertical ZnO nanowires on a sapphire substrate. Two configurations of the nanowires were studied: 40 nm diameter, 4.1 μm height, 3.5% surface coverage; and 55 nm diameter, 1.1 μm height, 42% surface coverage. We discuss the accuracy and limits of applicability of the analysis.
Original languageEnglish
Pages (from-to)116-120
Number of pages5
JournalNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Early online date8 Sep 2015
Publication statusPublished - 15 Mar 2016
Externally publishedYes


  • simulation
  • NDF
  • RBS
  • nanowires
  • ZnO


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