A refined quasi-static method for precise determination of piezoelectric coefficient of nanostructured standard and inclined thin films

Keyphrases

• Nanostructures 100%
• Piezoelectric Coefficient 100%
• Quasi-static Method 100%
• Crystalline Thin Films 100%
• Medical Imaging 50%
• Non-destructive Testing 50%
• Piezoelectric Materials 50%
• Energy Harvesting 50%
• High Variability 50%
• Parameter Optimization 50%
• Nanostructured Thin Films 50%
• Sputter-deposited 50%
• Ultrasonic Sensor 50%
• Dynamic Force 50%
• Flexible Wearable Sensor 50%
• Static Force 50%
• Piezoelectric Response 50%
• Nanoscale Devices 50%
• Higher Integrability 50%
• Piezoelectric Coefficient d33 50%
• Ultrasonic Actuator 50%
• Indirect Estimation 50%

Engineering

• Thin Films 100%
• Piezoelectric Coefficient 100%
• Static Method 100%
• Non-Destructive Testing 16%
• Piezoelectric Material 16%
• Energy Harvesting 16%
• Nanoscale 16%
• Piezoelectric 16%
• Ultrasonic Sensor 16%
• Integrability 16%
• Sufficient Detail 16%
• Dynamic Force 16%
• Actuator 16%

Material Science

• Thin Films 100%
• Piezoelectricity 100%
• Film 33%
• ZnO 33%
• Non-Destructive Testing 16%
• Actuator 16%
• Piezoelectric Material 16%